Beschreibung
* tester hardware, the DFX concept and the test program structure.* teradyne MicroFlex test system for test time optimized implementation of spec requirements.
* document the spec requirements tests in a test spec document with a given format
* debug first silicon using the developed test program
* semiconductor mixed -"signal power-testing (ATE) on Teradyne MicroFlex
* programming skills e.g. VBA, C / C++
* DfX experience including analog-mixed-signal as a plus
Schlagwörter:
semiconductor, mixed-signal power testing, Teradyne Microflex, VBA, Halbleiter; Versuch, Prüffeld
Kontaktperson: Niederlassungsleiter Herr Gerhard Jandl
FERCHAU Engineering Austria GmbH
Niederlassung Graz
Dr.-Auner-Straße 20
8074 Graz-Raaba